Effect of annealing of Ag ultrathin films on Co/Pt(111) surface

University of Taipei > 理學院 > 應用物理暨化學學系暨碩士班 > 期刊論文 > Item 987654321/2575

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题名:	Effect of annealing of Ag ultrathin films on Co/Pt(111) surface
作者:	Shern, C. S. Tsay, J. S. Chen, S. L. Wu, Y. E. 吳月娥蔡志申
贡献者:	Journal of Applied Physics
日期:	1999
上传时间:	2009-07-27 14:34:35 (UTC+8)
摘要:	Low-energy electron diffraction was used to study the annealing effects of Ag ultrathin films on the surface of one monolayer Co/Pt(111). The intensity of the specular beam versus temperature has an unusual minimum point and maximum point. Further studies by Auger electron spectroscopy indicate that the adatoms of Ag become a best ordered state after the formation of Co-Pt alloy is complete. The new order state comes from the structure change of Co/Pt(111) and the smaller lattice mismatch between Ag and Pt. The electron density of states of d band shifts to a lower binding energy when the system starts to form the Co-Pt alloy measured by ultraviolet photoelectron spectroscopy. The chemical compositions at interfaces of the thin film were investigated by a depth profile before and after the annealing. The sputtering rates of Ag on the topmost layer of the unannealed film and the annealed film were calculated and comparatively studied. A shadow effect causes the different sputtering rates of these two ultrathin films. Keywords: silver, cobalt, platinum, annealing, metallic thin films, low energy electron diffraction, Auger effect, interface
關聯:	Journal of Applied Physics, V85(1), p. 228-232
显示于类别:	[應用物理暨化學學系暨碩士班] 期刊論文

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